FSM 128 C2C from Tech-Semi, Inc.
| Vendor/Supplier | FSM Frontier Semiconductor Measurements, Inc. |
| Model | 128L C2C |
| Serial No. | 020211-428 |
| Process | Stress Measurement |
| Year of Manufacture | 2/11/02 |
REFURBISHED 10/2019
Asset Description
Frontier Semiconductor is the leading manufacturer of stress measurement tools for semiconductor, MEMS, optoelectronic, and flat panel applications. Stress and wafer bow maps can be acquired over the entire wafer surface, providing process engineers means to characterize and develop new processes using different thin film materials.
The FSM 128 Series systems are room temperature, full-wafer 2D/3D stress mapping systems. 128 systems use FSM's patented non-contact Optic-Lever dual-laser auto-switching technology featuring a micro-positioning detector to measure the laser beam deflection with high precision over a large dynamic range of small to large bow or stress. FSM's stress gauges have the ability to scan 1000 points per inch in seconds for high resolution, high precision stress mapping on blanked and patterned wafers.
